Fragmented data
Metrology, process, yield, and engineering context often sit in separate systems.
Semiconductor Manufacturing
Digital Twin Intelligence for Semiconductor Manufacturing
Connect fab data, detect anomalies, and accelerate root-cause investigation.
Zigoraat brings fragmented fab data into one vendor-agnostic intelligence workflow for defect review, signal correlation, and engineering decision support.
ZIGORAAT FAB INTELLIGENCE
Example workflow mockup
Imaging
Metrology
Process
Yield
Example confidence score
Example: 87%
Example correlated signal
Etch signal deviation
Example defect map
Example recommended action
Example: review lot, inspect signal deviation, compare recent runs.
Example workflow prompt
Ask about defect cluster…
Faster Investigation
Connect evidence across tools and reduce manual data stitching.
Vendor-Agnostic Architecture
Built for mixed tool, data, and system environments.
Fab-Scale Workflow Design
Organize context across tools, recipes, wafers, and lots.
Yield-Focused Engineering
Prioritize signals during engineering review.
Data in
Electron Microscopy
Metrology
Process
MES/SPC
Yield
Zigoraat layer
Normalize
Correlate
Detect
Guide
Engineering review
Investigation path
Confidence
Next step
The Problem
Semiconductor fabs are data-rich but insight-poor.
Fab teams work across disconnected tools, recipes, wafers, and data systems. When defects appear, engineers must rebuild context manually.
Root-cause investigation is manual
Engineers move between images, logs, recipes, and reports to reconstruct what happened.
Yield impact compounds
Late signals can affect more wafers before the issue is understood.
The Platform
One vendor-agnostic intelligence layer for fab data workflows.
Zigoraat organizes fab data into a shared investigation layer for engineering teams.
- Connect metrology, inspection, process, MES, SPC, and yield data
- Normalize fragmented tool and system context
- Correlate signals across wafers, lots, recipes, and defects
Workflow example — not production performance metrics
Data domains
What Zigoraat connects
Key data domains for fab investigation.
Electron Microscopy / Inspection
SEM images, defects, measurements, and review context.
Metrology
Dimensional data, wafer variation, and process indicators.
Process Tools
Recipe context, chamber signals, and run history.
MES / SPC
Lot history, control charts, and process windows.
Yield
Wafer trends, failure patterns, and downstream indicators.
Engineering Knowledge
Notes, reports, review steps, and feedback.
How It Works
How Zigoraat works across fab data.
Connect
Bring fab data into one workflow.
Normalize
Organize fragmented context.
Correlate
Link signals across tools and wafers.
Guide
Surface review paths and next steps.
The Product
From tool to intelligence.
Tool guidance, image analysis, and engineering review in one view.
Prototype / example workflow
Tool Guidance
Structured context during capture and review.
Image Analysis
Defects, measurements, and regions organized for review.
Engineering Review
Signals prepared for comparison and next-step decisions.
Who It's For
Built for the people who run the fab floor.
One investigation layer for teams across process, metrology, inspection, and yield.
Semiconductor Foundries
Pure-play fabs
Leading-edge fabs
Mature & specialty fabs
SiC / compound fabs
IDMs
Memory fabs
Logic & mixed-signal
Power & analog
Vertically integrated chipmakers
ZIGORAAT
Digital Twin for Fab Workflows
Multi-vendor fab environments
Faster root-cause review
Cross-tool signal context
Detection to decision support
Process & Yield Engineers
Defect analysis
Process development
Technology ramp
Fab monitoring
Equipment & Tool Ecosystem
Metrology & inspection
Etch, deposition & lithography
SPC & MES
Process control
Platform Direction
Workflow benefits without OEM lock-in.
Faster root-cause workflows
Less manual data stitching across tools, wafers, recipes, and yield context.
Engineering decision support
Review paths, confidence indicators, and possible next steps.
Cross-tool intelligence
Signals connected across metrology, process, MES, SPC, and yield.
Yield-focused investigation
Earlier issue detection and clearer process-drift context.
Get In Touch
Bring fab data into one intelligence workflow.
See how Zigoraat supports defect analysis and engineering review workflows.
Request Demo
Or reach us at support@zigoraat.com