Zigoraat

Automating the semiconductor workflow.
Starting with metrology. Expanding into a complete ecosystem.

From Measurement to Action. Automatically.

Real-time, closed-loop workflow control for semiconductor metrology.

Tool Measurement Signal Zigoraat Action
Measurement drives action

Zigoraat is an automation layer that turns semiconductor measurements into decisions. As process complexity increases, data is no longer the bottleneck. Zigoraat treats measurements as signals and uses them to drive continuous, closed-loop action across existing tools and teams.

Key Applications

Zigoraat supports semiconductor workflows from early development through high-volume manufacturing by automating how measurements drive decisions.

Process Development

Standardize measurement interpretation to accelerate learning.

Technology Ramp

Detect real process shifts early with continuous feedback.

Manufacturing Monitoring

Track tool and process behavior consistently and at scale.

Root Cause Analysis

Link measurements, tool settings, and execution history.

Why Metrology Needs Automation

Today's Metrology Workflow Tool Manual Analysis Report Delayed Decision Measurement is passive Slow feedback. Inconsistent decisions. Human bottlenecks. Shorter R&D Cycles Faster iteration demands rapid measurement More Steps & Higher Sampling Increased process complexity Tighter Specs as Design Rules Shrink Shrinking geometries demand precision In-die & Complex Structures Advanced 3D architectures New Materials & Composition Control Novel materials need precise monitoring Chemical Control for HAR Structures High aspect ratio filling control Topography & Profile 3D Packaging Multi-layer stacking surface metrology Local Variation is Critical Density & Z-profiling reveal variations Monitoring More Parameters Broader metrology scope needed

Interested in Zigoraat?

Contact Us